Testing of 3-D technology for carry-on bags at JFK Airport!
Passengers at JFK Airport in New York will soon be experiencing a test of more advanced and three-dimensional imaging to screen for carry-on bags.
On Thursday, the TSA and American Airlines stated that a test of computed-tomography scanners will be starting later this month at Terminal 8 of JFK.
To get a better idea of what’s inside a bag, the machines let screeners manipulate 3-D images.
The advantage of 3D technology to standard traditional X-ray is what most travelers are seeing at airport checkpoints, that a TSA officer can rotate the image digitally for examining a suspicious item without unpacking a bag.
To highlight suspicious materials, the color image can also be programmed which could someday reduce the need for removing laptops or separating larger containers of liquids from carry-on bags.
Similar tests in Phoenix and Boston are being done by TSA since last year.
To scan checked bags TSA uses 3-D imaging, but until recently for use at security checkpoints the scanners have been too large and heavy. So screeners use older X-ray technology to inspect carry-on bags.
3-D scanning will improve security right away as TSA Administrator David Pekoske remarked.
- Air Flight Booking (11)
- Airline Reviews (16)
- Airport Reviews (11)
- Business Class Flights (1)
- Canada to India Flights (6)
- Cancellation Policy (6)
- Cheap flights to india (11)
- Do You Know (24)
- Last Minute Flights To India (5)
- Late Night Flights (1)
- latest (12)
- NEWS (211)
- Non Stop Flights (1)
- Restricted Items (1)
- Travel Tips (24)
- US to India Flight Deals (4)
- USA to india business class flights (15)
- USA To India Flights (12)
- Visa Information (4)