Testing of 3-D technology for carry-on bags at JFK Airport!

Passengers at JFK Airport in New York will soon be experiencing a test of more advanced and three-dimensional imaging to screen for carry-on bags.

On Thursday, the TSA and American Airlines stated that a test of computed-tomography scanners will be starting later this month at Terminal 8 of JFK.

To get a better idea of what’s inside a bag, the machines let screeners manipulate 3-D images.

The advantage of 3D technology to standard traditional X-ray is what most travelers are seeing at airport checkpoints, that a TSA officer can rotate the image digitally for examining a suspicious item without unpacking a bag.

To highlight suspicious materials, the color image can also be programmed which could someday reduce the need for removing laptops or separating larger containers of liquids from carry-on bags.

Similar tests in Phoenix and Boston are being done by TSA since last year.

To scan checked bags TSA uses 3-D imaging, but until recently for use at security checkpoints the scanners have been too large and heavy. So screeners use older X-ray technology to inspect carry-on bags.

3-D scanning will improve security right away as TSA Administrator David Pekoske remarked. JFK Airport passengers will soon experience advanced 3D bag screening technology, enhancing security and convenience—book flights with MintFares for a seamless journey!

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